APL Technologies specializes on the design and manufacturing
of two types of probe cards: high speed and standard probe cards
for silicon and gallium arsenide wafers.
 

 

 

High Speed Probe Card	Standard Blade Type Probe Card
Fact Sheet Covering: Ground (GND). Power Plane (VDD, VCC). Signal Integrity.	Fact Sheet Covering: Soldering technique. Properties of the probe materials. Force from probe tip to wafer surface. Edge Sensor. Temperature probing. Problem solving or prevention.